T. Puritis, PROBLEMS RELATED TO THE AVALANCHE AND SECONDARY BREAKDOWN OF SILICON P-N-JUNCTION, Microelectronics and reliability, 37(5), 1997, pp. 713-719
The paper provides an analysis of some still unsolved problems related
to avalanche and secondary breakdown. An evaluation is given of four
models of energy accumulation, necessary for impact ionization: Wolfs
diffusion model, Shockley's model of 'lucky' electrons, Ridely's model
of 'lucky-drift' and Gribnikov's model of 'light' electrons. It is sh
own that impact ionization is mainly realized in conformity with the m
odel of 'light' charge carriers. It is indicated that the bright avala
nche breakdown channels, called microplasmas, are encircled by a weakl
y shining ring-shaped cloud. Apparently this cloud is caused by the'li
ght' charge carriers. As the p-n junction is heated under the influenc
e of a high avalanche breakdown current and reaches a certain temperat
ure, the luminous clouds expand and by force of the magnetic pinch cre
ated by the current itself tend towards the centre, where they meet an
d assume the form of a ring. Then the weakly shining cloud (pre-mesopl
asma) contracts rapidly and bright circular mesoplasma lights up (seco
ndary breakdown appears) which moves in the direction of higher temper
ature and higher voltage until it localizes at a large defect or conta
ct. A model is proposed according to which pre-mesoplasma and mesoplas
ma is a Row of 'light' charge carriers. This model allows us to explai
n many peculiarities of pre-mesoplasma and mesoplasma. Copyright (C) 1
997 Elsevier Science Ltd.