Angle calculations are presented for a new type of diffractometer suit
able for surface X-ray diffraction. The new geometry results from comb
ining the four-circle and the z-axis geometries and involves six circl
es. Instruments based on this concept can be operated in different dif
fraction geometries. Compared to the four-circle and z-axis geometries
, a larger fraction of the reciprocal space perpendicular to the sampl
e is available to experiments when all six circles are used. This resu
lts in an improved out-of-plane resolution in any X-ray structure stud
y. In each geometry, either the angle of incidence or the outgoing ang
le of the X-rays can be chosen. At the same time, the surface normal c
an be aligned in the horizontal diffractometer plane, providing optimu
m resolution and sample illumination. All equations are given in close
d form. The different modes of operation are compared and operation sc
hemes are discussed.