CHARACTERIZATION OF GAAS AND INGAAS DOUBLE-QUANTUM-WELL HETEROSTRUCTURE FETS

Citation
D. Theron et al., CHARACTERIZATION OF GAAS AND INGAAS DOUBLE-QUANTUM-WELL HETEROSTRUCTURE FETS, I.E.E.E. transactions on electron devices, 40(11), 1993, pp. 1935-1941
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189383
Volume
40
Issue
11
Year of publication
1993
Pages
1935 - 1941
Database
ISI
SICI code
0018-9383(1993)40:11<1935:COGAID>2.0.ZU;2-2
Abstract
Among the large variety of heterostructure field effect transistors, m ultichannel devices present a particular originality: their transcondu ctance profile is very flexible and depends on the structure parameter s. They are therefore naturally tailormade for high signal non linear applications. In this paper, the specific case of double quantum-well structures is studied. Conventional and pseudomorphic devices are char acterized under dc and RF conditions. Very high current densities (up to 1.2 A/mm) are demonstrated. The effect of different structural para meters on the transconductance and cut-off frequency is discussed. The results are analyzed in order to give a full understanding of these d evices and to demonstrate their performances.