EXCESS DARK CURRENT DUE TO SAW DAMAGE IN SEMIINSULATING GAAS

Authors
Citation
Zq. Fang et Dc. Look, EXCESS DARK CURRENT DUE TO SAW DAMAGE IN SEMIINSULATING GAAS, Journal of electronic materials, 22(11), 1993, pp. 1361-1363
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
ISSN journal
03615235
Volume
22
Issue
11
Year of publication
1993
Pages
1361 - 1363
Database
ISI
SICI code
0361-5235(1993)22:11<1361:EDCDTS>2.0.ZU;2-A
Abstract
Logarithmic plots of current or carrier concentration vs inverse tempe rature in semi-insulating GaAs samples are nearly always well characte rized by straight lines with a donor activation energy of 0.76 +/- 0.0 2 eV, as long as the surfaces are well polished or etched and the edge s are cleaved. However, edges cut with common dicing saws produce an e xcess conductance which can dominate the bulk conductance at room temp erature and below. This excess conductance is due to carrier hopping b etween defects in a surface layer of approximately 2000angstrom thickn ess, which can be easily removed by etching. Some polished surfaces al so exhibit this same effect.