200-DEGREES-C OPERATION OF SEMICONDUCTOR POWER DEVICES

Citation
Rw. Johnson et al., 200-DEGREES-C OPERATION OF SEMICONDUCTOR POWER DEVICES, IEEE transactions on components, hybrids, and manufacturing technology, 16(7), 1993, pp. 759-764
Citations number
10
Categorie Soggetti
Material Science","Engineering, Eletrical & Electronic
ISSN journal
01486411
Volume
16
Issue
7
Year of publication
1993
Pages
759 - 764
Database
ISI
SICI code
0148-6411(1993)16:7<759:2OOSPD>2.0.ZU;2-2
Abstract
There is a growing need for commercial and military power electronics to operate above 175-degrees-C. Changes in operating parameters at 200 -degrees-C have been measured for four devices, an N-P-N bipolar junct ion transistor (BJT), an insulated gate bipolar transistor (IGBT), an N-channel metal-oxide-semiconductor field effect transistor (MOSFET), and a P-type MOS controlled thyristor (MCT). Using the results of thes e measurements, power supplies have been built using IGBT's and MOSFET 's and operated at an ambient temperature of 200-degrees-C for up to 7 2 h.