IN-SITU DOMAIN MULTIPLICATION AND MIGRATION IN THE ANTIFERROELECTRIC CERAMIC PLSNZT

Citation
M. Degraef et al., IN-SITU DOMAIN MULTIPLICATION AND MIGRATION IN THE ANTIFERROELECTRIC CERAMIC PLSNZT, Ultramicroscopy, 52(2), 1993, pp. 179-185
Citations number
7
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
52
Issue
2
Year of publication
1993
Pages
179 - 185
Database
ISI
SICI code
0304-3991(1993)52:2<179:IDMAMI>2.0.ZU;2-D
Abstract
The domain structures of an antiferroelectric perovskite in the system (Ph, La)(Zr, Sn, Ti)O-3 have been examined over a range of length sca les by TEM. The structure consists of multiple orientation variants of a long range incommensurate modulation running along one of the < 110 > directions with an approximate wavelength 9a/root 2. The incommensu rate modulation gives rise to several characteristic patterns of contr ast. Beam-induced charging causes domain wall migration in specimens w ith an incomplete conductive coating. In one instance, a novel regener ative domain source was observed.