Thermal annealing of n-type liquid phase epitaxial gallium arsenide is
examined. It is shown that low 10(15) CM-3 n-type electrically active
impurity levels can be reduced to 3 x 10(13) CM-3 by long term anneal
ing. Conversely, it is also shown that p-type liquid phase epitaxial (
LPE) gallium arsenide when thermally annealed will show an increase in
the net acceptor density. A mechanism for this effect is proposed.