SIMULATING THE EXIT WAVE-FUNCTION FOR UNIFORMLY DISORDERED-SYSTEMS

Citation
Jp. Chevalier et Mj. Hytch, SIMULATING THE EXIT WAVE-FUNCTION FOR UNIFORMLY DISORDERED-SYSTEMS, Ultramicroscopy, 52(3-4), 1993, pp. 253-259
Citations number
10
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
52
Issue
3-4
Year of publication
1993
Pages
253 - 259
Database
ISI
SICI code
0304-3991(1993)52:3-4<253:STEWFU>2.0.ZU;2-P
Abstract
We describe a simple formalism to simulate the exit wave function for uniformly disordered systems. The method employed is equivalent to int roducing random phases in real space, and allows one to describe the s pecimen shape, to use physically reasonable potentials as well as an a verage local atomic correlation. Examples will be given which demonstr ate the suitability of the formalism to the simulation of: HREM images of amorphous material, HREM images of alloys containing short-range o rder, microdiffraction patterns from homogeneously disordered material s, diffraction patterns from amorphous materials and HREM images of cr ystalline materials coated with damage layers.