COMMERCIAL SPECTROMETER MODIFICATIONS FOR ENERGY-FILTERING OF ELECTRON-DIFFRACTION PATTERNS AND IMAGES

Authors
HOLMESTAD R KRIVANEK OL HOIER R MARTHINSEN K SPENCE JCH
Citation
R. Holmestad et al., COMMERCIAL SPECTROMETER MODIFICATIONS FOR ENERGY-FILTERING OF ELECTRON-DIFFRACTION PATTERNS AND IMAGES, Ultramicroscopy, 52(3-4), 1993, pp. 454-458
Citations number
18
Categorie Soggetti
Microscopy
Journal title
Ultramicroscopy → ACNP
ISSN journal
03043991
Volume
52
Issue
3-4
Year of publication
1993
Pages
454 - 458
Database
ISI
SICI code
0304-3991(1993)52:3-4<454:CSMFEO>2.0.ZU;2-T
Abstract
A commercial parallel electron energy loss spectrometer (PEELS) system has been modified to allow it to record, line by line, two-dimensiona l energy-filtered electron diffraction patterns or images. The results given for convergent beam electron diffraction patterns in silicon sh ow that the performance of the system is intermediate between that of an imaging energy filter (such as an omega filter) and a serial scanne d readout Grigson system.