EXPERIMENTAL LOW-VOLTAGE POINT-PROJECTION MICROSCOPY AND ITS POSSIBILITIES

Authors
SPENCE JCH QIAN W MELMED AJ
Citation
Jch. Spence et al., EXPERIMENTAL LOW-VOLTAGE POINT-PROJECTION MICROSCOPY AND ITS POSSIBILITIES, Ultramicroscopy, 52(3-4), 1993, pp. 473-477
Citations number
21
Categorie Soggetti
Microscopy
Journal title
Ultramicroscopy → ACNP
ISSN journal
03043991
Volume
52
Issue
3-4
Year of publication
1993
Pages
473 - 477
Database
ISI
SICI code
0304-3991(1993)52:3-4<473:ELPMAI>2.0.ZU;2-4
Abstract
The design of a lensless, low-voltage point-projection electron micros cope is described, operating at 90-400 V. Experimental images of thin carbon films are reported, and it is shown that high-resolution images may be obtained without high-temperature treatment of the tip, greatl y simplifying construction and improving stability. Image interpretati on, radiation damage, source brightness, tip aberrations and applicati ons of the instrument are discussed, and the effective source size is estimated.