Kk. Sharma et Rk. Bhutani, ANALYSIS OF POSTERIOR AVAILABILITY DISTRIBUTIONS OF SERIES AND PARALLEL SYSTEMS, Microelectronics and reliability, 34(2), 1994, pp. 379-381
The lifetime distribution of an engineering system is a powerful tool
for analysing the system in respect of its reliability characteristics
. The analysis can be improved if the experimenter has, and is able to
combine, the prior belief about the system with the operational or ex
perimental data. Moreover, in many situations, the operational data wi
th the complete system may either be costlier or non-existent. The pro
blem can still be tackled by making use of such information available
on the subunits or components of the system. Pursuing these concepts,
the present study deals with the analysis of posterior availability di
stributions for a series and a parallel system. Time truncated failure
and repair information and prior beliefs about the failure and repair
rates of the components of the systems have been employed in the anal
ysis.