BEAM INTERACTIONS IN A FOCUSED ION-BEAM SYSTEM WITH A LIQUID-METAL ION-SOURCE

Citation
Pwh. Dejager et Lj. Vijgen, BEAM INTERACTIONS IN A FOCUSED ION-BEAM SYSTEM WITH A LIQUID-METAL ION-SOURCE, Microelectronic engineering, 23(1-4), 1994, pp. 107-110
Citations number
NO
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
ISSN journal
01679317
Volume
23
Issue
1-4
Year of publication
1994
Pages
107 - 110
Database
ISI
SICI code
0167-9317(1994)23:1-4<107:BIIAFI>2.0.ZU;2-4
Abstract
The quality of focused ion beam systems strongly depends on the aberra tions of the optical elements and the Coulomb interactions between the beam particles. For a one lens system, with an image distance of 500 mm, it is shown, both experimentally and by simulation that a minimum spotsize of about 100 mu m is observed, although the geometrical diame ter is only 7.2 mu m, including aberration effects. The influence of C oulomb interactions on the current density is also demonstrated: the c urrent density on the target even decreases with increasing beam curre nt.