Pwh. Dejager et Lj. Vijgen, BEAM INTERACTIONS IN A FOCUSED ION-BEAM SYSTEM WITH A LIQUID-METAL ION-SOURCE, Microelectronic engineering, 23(1-4), 1994, pp. 107-110
The quality of focused ion beam systems strongly depends on the aberra
tions of the optical elements and the Coulomb interactions between the
beam particles. For a one lens system, with an image distance of 500
mm, it is shown, both experimentally and by simulation that a minimum
spotsize of about 100 mu m is observed, although the geometrical diame
ter is only 7.2 mu m, including aberration effects. The influence of C
oulomb interactions on the current density is also demonstrated: the c
urrent density on the target even decreases with increasing beam curre
nt.