BUILDING IN RELIABILITY FOR SILVER DIE ATTACHED LIGHT-EMITTING-DIODES

Authors
Citation
Wk. Chim et Ky. Chong, BUILDING IN RELIABILITY FOR SILVER DIE ATTACHED LIGHT-EMITTING-DIODES, Microelectronics and reliability, 34(3), 1994, pp. 495-507
Citations number
5
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00262714
Volume
34
Issue
3
Year of publication
1994
Pages
495 - 507
Database
ISI
SICI code
0026-2714(1994)34:3<495:BIRFSD>2.0.ZU;2-G
Abstract
In this paper, we present a failure analysis and reliability case hist ory of light emitting diodes (LEDs), used in a fibre optics transmitte r product, bonded using silver die attach epoxy. The observed failure mode was a reduction in light output of the transmitter device due to increased forward voltage after pulsed, high current operation which w as attributed to the electrical degradation of the silver die attach e poxy. Steps taken to design in reliability into the product involved e xperimental design to optimize the die attach process, evaluation of m ore robust epoxies which can withstand accelerated high temperature an d high current burn-in conditions, and the use of an improved die back -contact metallization system. Reliability performance of the die atta ch system was predicted and extrapolated to actual field application a nd burn-in conditions.