Tm. Cockerill et al., WAVELENGTH TUNING IN STRAINED-LAYER INGAAS-GAAS-ALGAAS QUANTUM-WELL LASERS BY SELECTIVE-AREA MOCVD, Journal of electronic materials, 23(2), 1994, pp. 115-119
Selective-area growth and regrowth using conventional atmospheric pres
sure metalorganic chemical vapor deposition is investigated for wavele
ngth tuning in strained layer InxGa1-xAsGaAs-AlyGa1-yAs quantum well l
asers. Growth inhibition from a silicon dioxide mask is the mechanism
used for the selective-area growth rate enhancement. By varying the wi
dth of the oxide stripe opening, differences in the growth rate yield
different quantum well thicknesses, and hence different lasing wavelen
gths for devices on the same wafer. Both two- and three-step growth pr
ocesses are utilized for selective-area epitaxy of strained layer InxG
a1-xAs-GaAs quantum well active regions, with lasers successfully fabr
icated from the three-step growth. Scanning electron microscopy and tr
ansmission electron microscopy indicate that the absence of an oxide m
ask during AlyGa1-yAs growth is essential for successful device operat
ion. A wide wavelength tuning range of over 630 angstrom is achieved f
or lasers grown on the same substrate.