SHORT-PERIOD CDTE(ZNTE) MNTE SUPERLATTICES - GROWTH AND CHARACTERIZATION/

We report on the growth of CdTe/MnTe and ZnTe/MnTe short-period superl attices. The CdTe and ZnTe layers have been grown by atomic layer epit axy technique, and a quadrupole mass spectrometer controlled molecular beam epitaxy has been used for the MnTe layers growth. The critical t hickness of MnTe on both CdTe and ZnTe layers has been determined by r eflected high energy electron diffraction experiments and the structur e of the superlattices was studied by X-ray diffraction analysis.