A previously unnoticed effect that occurs in microanalysis by electron
energy-loss spectrometry (EELS) in image mode has been investigated,
namely the shift of the inelastic image relative to the elastic one. A
method is proposed for correction of the shift in the microscope. It
is shown by way of example that quantitative microanalysis with a sens
itivity limit corresponding to nanometer-sized precipitates is possibl
e, with full visual control of the area, when a parametric model for t
he spatial distribution of elements in the specimen can be defined.