The use of gas source molecular beam epitaxy, using hydrogen selenide
and elemental Zn as source materials, has resulted in the growth of hi
gh quality ZnSe on closely lattice-matched GaAs and (In,Ga)P. The undo
ped ZnSe epilayers are comparable in quality to material grown by mole
cular beam epitaxy, as indicated by narrow double-crystal x-ray diffra
ction rocking curves and intense photoluminescence dominated by a sing
le donor-bound near-bandedge excitonic feature. Nitrogen species, deri
ved from a radio frequency plasma source, are successfully used as acc
eptor impurities for ZnSe; photoluminescence spectra confirm the incor
poration of nitrogen by the presence of the expected donor-to-acceptor
pair recombination. Atomic concentrations of nitrogen as high as 5 x
10(18) cm-3, are measured by secondary ion mass spectroscopy. Thus far
, capacitance-voltage measurements indicate net acceptor concentration
s (N(A) - N(D)) of approximately 10(17) cm-3.