GAS-SOURCE MOLECULAR-BEAM EPITAXY OF ZNSE AND ZNSE-N

Citation
Ca. Coronado et al., GAS-SOURCE MOLECULAR-BEAM EPITAXY OF ZNSE AND ZNSE-N, Journal of electronic materials, 23(3), 1994, pp. 269-273
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
ISSN journal
03615235
Volume
23
Issue
3
Year of publication
1994
Pages
269 - 273
Database
ISI
SICI code
0361-5235(1994)23:3<269:GMEOZA>2.0.ZU;2-Q
Abstract
The use of gas source molecular beam epitaxy, using hydrogen selenide and elemental Zn as source materials, has resulted in the growth of hi gh quality ZnSe on closely lattice-matched GaAs and (In,Ga)P. The undo ped ZnSe epilayers are comparable in quality to material grown by mole cular beam epitaxy, as indicated by narrow double-crystal x-ray diffra ction rocking curves and intense photoluminescence dominated by a sing le donor-bound near-bandedge excitonic feature. Nitrogen species, deri ved from a radio frequency plasma source, are successfully used as acc eptor impurities for ZnSe; photoluminescence spectra confirm the incor poration of nitrogen by the presence of the expected donor-to-acceptor pair recombination. Atomic concentrations of nitrogen as high as 5 x 10(18) cm-3, are measured by secondary ion mass spectroscopy. Thus far , capacitance-voltage measurements indicate net acceptor concentration s (N(A) - N(D)) of approximately 10(17) cm-3.