Three typical error sources in fabrication of multilevel computer gene
rated phase holograms are investigated. These are (i) misalignment of
different mask levels (ii) phase errors caused by deviation of the etc
hing depth and (iii) pattern errors due to overetching or undercutting
. Analytic expressions for both the faulty transmission function and t
he associated diffraction orders are given. The investigations are bas
ed on the Fresnel/Kirchhoff approximation. Computer simulations are co
mpared with experimental data. Different fabrication methods for multi
level phase structures are analyzed.