MORPHOLOGY AND FORMATION OF THE COLOR CORE OF BI12SIO20 CRYSTALS GROWN BY THE CZOCHRALSKI METHOD

Single crystals of pure and Fe3+ doped bismuth silicon oxide (Bi12SiO2 0) have been grown by the Czochralski method. Bi12SiO20 Crystals grown over a wide range of conditions show an obvious tendency towards face ting. The faceting morphologies of crystals grown along 1001] and [111 ] are reported. During growth, Bi12SiO20 (BSO) crystals abruptly withd rawn from the melt confirmed the presence of interfacial {110} facets and revealed a conical interface surface in the regions between the fa cets. In addition, the color core in single crystals of Bi12SiO20 grow n by the Czochralski method has been analyzed using quantitative energ y dispersive X-ray spectroscopy.