ATOMIC-FORCE MICROSCOPY OF LEAD IODIDE CRYSTAL-SURFACES

Atomic force microscopy (AFM) was used to characterize the surface of lead iodide crystals. The high vapor pressure of lead iodide prohibits the use of traditional high resolution surface study techniques that require high vacuum conditions. AFM was used to image numerous insulat ing surfaces in various ambients, with very little sample preparation techniques needed. Freshly cleaved and modified surfaces, including, c hemical and vacuum etched, and air aged surfaces, were examined. Both intrinsic and induced defects were imaged with high resolution. The re sults were compared to a similar AFM study of mercuric iodide crystal surfaces and it was found that, at ambient conditions, lead iodide is significantly more stable than mercuric iodide.