A KINETICS AND TRANSPORT MODEL OF DICHLOROSILANE CHEMICAL-VAPOR-DEPOSITION

Citation
Kl. Knutson et al., A KINETICS AND TRANSPORT MODEL OF DICHLOROSILANE CHEMICAL-VAPOR-DEPOSITION, Journal of crystal growth, 140(1-2), 1994, pp. 191-204
Citations number
64
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
140
Issue
1-2
Year of publication
1994
Pages
191 - 204
Database
ISI
SICI code
0022-0248(1994)140:1-2<191:AKATMO>2.0.ZU;2-C
Abstract
Computational fluid dynamics is employed to examine silicon growth on a (100) surface in a dichlorosilane-hydrogen chemical vapor deposition (CVD) system. Species balances are solved in conjunction with mass, m omentum, and energy balances to predict growth rates in the system. Th e gas-phase mechanism includes the DCS decompositions SiH2Cl2 --> SiCl 2 + H-2 and SiH2Cl2 --> SiHCl + HCl and the surface mechanism accounts for adsorption and growth from SiCl2, SiHCl, and SiH2Cl2. Arrhenius p lots from the model show good agreement with experiment for overall gr owth rates at low DCS inflow concentrations but over predicts growth r ates for higher DCS inflow concentrations. A sensitivity analysis is p resented in the form of Arrhenius plots for several of the more import ant reactions included in the mechanism. The model suggests that growt h rates are very sensitive to the gas-phase decomposition of SiH2Cl2 a nd the dissociative adsorption of SiH2Cl2 and not very sensitive to th e dissociative adsorption of H-2 and the activation energy for the sur face growth from adsorbed SiCl and H by elimination of HCl.