M. Demurcia et al., HIGH-FREQUENCY NOISE AND DIFFUSION-COEFFICIENT OF HOT-ELECTRONS IN BULK AL0.25GA0.75AS, Solid-state electronics, 37(8), 1994, pp. 1477-1483
We present experimental results of hot electron noise in Si doped Al0.
25Ga0.75As test structures using pulsed high-frequency noise measureme
nts. Noise temperature and longitudinal diffusion coefficient as funct
ions of field strength are compared with those of Si doped GaAs. We fi
nd significant changes at high fields. Results are discussed in regard
of electron scattering mechanisms.