ZnTe single crystals grown by horizontal physical vapor transport (PVT
) and by vertical traveling heater method (THM) from a Te solution wer
e characterized by photoluminescence (PL) at 10.6 K and by atomic forc
e microscopy (AFM). Copper was identified by PL as a major impurity ex
isting in both crystals, forming a substitutional acceptor, Cu(Zn). Th
e THM ZnTe crystals were found to contain more Cu impurity than the PV
T ZnTe crystals. The formation of Cu(Zn)-V(Te) complexes and the effec
ts of annealing, oxygen contamination and intentional Cu doping were a
lso studied. Finally, the surface morphology analyzed by AFM was corre
lated to the PL results.