Microscopic four-contact probes to inversion layers adjacent to grain-
boundaries of semimagnetic HgCdMnTe have been photolithographically pa
tterned. Magnetoresistance measurements performed on these structures
revealed aperiodic conductance fluctuations of the magnitude of the or
der of e2/h. Analysis of both fluctuation amplitude and their mean per
iod indicated that the studied system was in mesoscopic regime. Additi
onally, strongly nonlinear current-voltage characteristics were detect
ed in the vicinity of the spin-glass freezing occurring at T = 100 mK.