POLARIZATION-DEPENDENT DEPHASING MEASUREMENTS IN CDXZN1-XTE ZNTE MULTIPLE-QUANTUM-WELL STRUCTURES/

Citation
Jp. Doran et al., POLARIZATION-DEPENDENT DEPHASING MEASUREMENTS IN CDXZN1-XTE ZNTE MULTIPLE-QUANTUM-WELL STRUCTURES/, Journal of crystal growth, 138(1-4), 1994, pp. 826-830
Citations number
14
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
138
Issue
1-4
Year of publication
1994
Pages
826 - 830
Database
ISI
SICI code
0022-0248(1994)138:1-4<826:PDMICZ>2.0.ZU;2-I
Abstract
Polarization dependent dephasing measurements are performed in inhomog eneously broadened CdxZn1-xTe/ZnTe multiple quantum wells at low and h igh exciton densities. At low temperature and density the self-diffrac ted signal when the beams are cross-polarized is much weaker than, and decays much faster than, the signal obtained when the beams are co-po larized. At high densities the signal strengths become the same. A mod el is proposed to explain the results. We find that the dynamics of a small subset of excitons which are created in a spatially bunched mann er can be probed by cross polarizing the beams.