DOUBLE RESOLUTION IMAGING WITH INFINITE DEPTH OF FOCUS IN SINGLE LENSSCANNING MICROSCOPY

A four-dimensional data-set recorded in a single lens scanning microsc ope provides sufficient information to reconstruct an unaberrated imag e of the (weak phase) specimen at twice the conventional resolution de fined by the width of the objective aperture and with infinite depth o f focus. We present experiments on the optical bench in the SOM config uration. The technique may be of considerable importance in the deconv olution of electron shadow images and Gabor holograms.