ANOMALOUS X-RAY-SCATTERING AT THE SULFUR EDGE OF POLY(3-OCTYLTHIOPHENE)

Anomalous X-ray diffraction was performed at the sulfur K edge of the partially crystalline conducting polymer poly(3-octylthiophene) (P3OT) . This is the first time anomalous diffraction at the sulfur edge has been used to obtain additional information on the structure of a polym er. A strong wavelength intensity variation of the 100 reflection was observed. This intensity change and the variation of the fluorescent s cattered background corroborate excellently with the theory and theore tical intensity calculations confirm previously suggested structural m odels.