EDIM93 - A PROGRAM FOR ELECTRON-DIFFRACTION INTENSITY MEASUREMENT FROM PHOTOGRAPHIC DATA

Authors
CHENG TZ WANG JF WAN ZH SHA BD
Citation
Tz. Cheng et al., EDIM93 - A PROGRAM FOR ELECTRON-DIFFRACTION INTENSITY MEASUREMENT FROM PHOTOGRAPHIC DATA, Journal of applied crystallography, 27, 1994, pp. 430-432
Citations number
8
Categorie Soggetti
Crystallography
Journal title
Journal of applied crystallography → ACNP
ISSN journal
00218898
Volume
27
Year of publication
1994
Part
3
Pages
430 - 432
Database
ISI
SICI code
0021-8898(1994)27:<430:E-APFE>2.0.ZU;2-K
Abstract
A program, EDIM93, for electron diffraction intensity measurement has been developed. The program processes the data from digitized electron diffraction films. The profile decomposition and summation methods ar e introduced for measuring the blackenings of diffraction spots. They are suitable for different distributions of the spots on the film. The program is applicable to periodic structures and to (3+1)- or (3+2)-d imensional incommensurately modulated structures.