SURFACE-ANALYSIS WITH ATOMIC-FORCE MICROSCOPY THROUGH MEASUREMENT IN AIR AND UNDER LIQUIDS

Atomic force microscopy offers a number of unique options that make it a valuable tool for analytical chemists. Especially the capability of imaging surfaces in gases and under liquids greatly enhances its appl icability to technological problems. In this paper we demonstrate the analytical potential of AFM with respect to topographical and atomic r esolution imaging, imaging under liquids and in-situ imaging of surfac e processes. Selected examples including metal films, glasses, alkali halides, electroluminescence displays, filtration membranes, organic t extile fibers and human hair are described.