SELECTIVELY EMBEDDED GROWTH BY CHEMICAL BEAM EPITAXY FOR THE FABRICATION OF INGAAS INP DOUBLE-HETEROSTRUCTURE LASERS/

Citation
M. Gotoda et al., SELECTIVELY EMBEDDED GROWTH BY CHEMICAL BEAM EPITAXY FOR THE FABRICATION OF INGAAS INP DOUBLE-HETEROSTRUCTURE LASERS/, Journal of crystal growth, 140(3-4), 1994, pp. 277-281
Citations number
13
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
140
Issue
3-4
Year of publication
1994
Pages
277 - 281
Database
ISI
SICI code
0022-0248(1994)140:3-4<277:SEGBCB>2.0.ZU;2-U
Abstract
In order to fabricate InGaAs/InP double-heterostructure (DH) lasers, a novel selectively embedded one-step growth by chemical beam epitaxy ( CBE) was adopted. Before the selective CBE growth, 6-8 mum wide channe ls on an n-InP substrate were undercut by wet chemical etching through a 170 nm thick SiO2 film mask. A 6 mum wide stripe-geometry DH laser structure with an active layer of 0.14 mum thickness was grown selecti vely with good planarity into the channels and operated by a pulse.