A Monte Carlo correction program for quantitative microanalysis on PC
computer is introduced in this paper. The elastic scattering is descri
bed by the screened Rutherford cross section. Instead of computing the
energy loss according to the actual path between two scatterings we h
ave defined the ''Bethe inelastic cross section'' determined by the Be
the-slowing-down approximation. It is assumed that it causes no angula
r departure of the scattered electron. In the second model we took int
o account the angular dependence of inelastic scattering assuming that
the primary electron interacts with quasi-free atom electrons. On the
basis of these two models analytical Monte Carlo programmes were deve
loped and experimentally tested on some oxide glass. Our results are f
ully comparable to those obtained by ten world microprobe laboratories
using classical ZAF correction or Bence-Albee methods. We have found
that introducing angular part of the inelastic cross section analytica
l results did not significantly change. All of our results were carrie
d out for bulk specimens but extending it to layers is under the devel
opment.