The aim of this paper is to present a practical and accurate program o
f correction based on a new mathematical description of phi(rhoz), whi
ch allows a global correction combining atomic number and absorption c
orrection [ZA]. Characteristic and continuum fluorescence corrections
are also included to complete the program. Elements of atomic number i
n the range 4 < Z < 92 and X-ray emission lines Kalpha, Kbeta, Lalpha,
Lbeta, Malpha and Mbeta are taken into account by the program which i
s especially designed for difficult cases (light elements, low overvol
tages, low accelerating voltages). This correction program written in
Fortran is designed to work off line under DOS or WINDOWS graphic oper
ating systems on PC compatible microcomputers. The WINDOWS user interf
ace environment makes the software easy to use. The computation and pl
ot of phi(rhoz) depth distribution function as well as the printing of
physical parameters enable the user to easily optimize the experiment
al conditions. This procedure has been tested on various databases (Po
uchou and Pichoir, Love et al. and Bastin et al.) for medium to heavy
elements. For the light elements (0, C and B) Bastin's database has be
en used. The results presented furthermore reveal the good accuracy of
the method and allow a comparison with other correction procedures.