EPMA ANALYSIS OF FLOAT GLASS SURFACES

This work concentrates on the setting-up of conditions for the quantit ative analysis of the composition profiles of major and minor componen ts of float glass surfaces with an electron probe micro-analyser. Sinc e surfaces are modified for depths of 10-50 mum, they have been studie d both in polished cross-section and perpendicularly to the electron b eam by varying its energy to investigate the near-surface region (0-3 mum). The results demonstrate that combined use of the two methods sup plies complete and continuous information on the quantitative distribu tion from large depths to the first layers of the float surfaces. The experimental conditions, sample preparation, in-depth and lateral reso lutions, precision and accuracy of the methods are also investigated.