ELECTRON-STIMULATED AND THERMAL-DESORPTION STUDY OF TRIMETHYLSILANE FROM SI(100)

Citation
Jh. Campbell et al., ELECTRON-STIMULATED AND THERMAL-DESORPTION STUDY OF TRIMETHYLSILANE FROM SI(100), Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 2128-2133
Citations number
11
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
ISSN journal
07342101
Volume
12
Issue
4
Year of publication
1994
Part
2
Pages
2128 - 2133
Database
ISI
SICI code
0734-2101(1994)12:4<2128:EATSOT>2.0.ZU;2-H
Abstract
The adsorption and decomposition of trimethylsilane, HSi(CH3)3, on Si( 100) has been studied at T approximately 120 K for a variety of trimet hylsilane exposures. The trimethylsilane molecule is not observed by q uadrupole mass spectrometry during temperature programmed desorption f rom the Si(100) sample, but various fragments of trimethylsilane can b e seen. The primary species seen desorbing during electron bombardment of the Si(100) surface were the H+, H-, and CH3+ ions. Both H+ and H- KEDs exhibit bimodal kinetic energy peaks, most likely due to hydroge n bound in multiple states. The bimodal H+ and H- kinetic-energy distr ibutions (KEDs) exhibit an interesting reversal of intensities that su ggests that the state giving rise to the low-energy peak in one KED gi ves rise to the high-energy peak in the other KED, and vice versa. Kin etic energy distributions for the CH3+ ions consisted of only one peak , indicating a high probability that the CH3+ originates from only one surface state. Our results indicate that electron-simulated desorptio n can be used as an adsorption state sensitive probe of chemical speci es on semiconductor surfaces.