Jh. Campbell et al., ELECTRON-STIMULATED AND THERMAL-DESORPTION STUDY OF TRIMETHYLSILANE FROM SI(100), Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 2128-2133
Citations number
11
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
The adsorption and decomposition of trimethylsilane, HSi(CH3)3, on Si(
100) has been studied at T approximately 120 K for a variety of trimet
hylsilane exposures. The trimethylsilane molecule is not observed by q
uadrupole mass spectrometry during temperature programmed desorption f
rom the Si(100) sample, but various fragments of trimethylsilane can b
e seen. The primary species seen desorbing during electron bombardment
of the Si(100) surface were the H+, H-, and CH3+ ions. Both H+ and H-
KEDs exhibit bimodal kinetic energy peaks, most likely due to hydroge
n bound in multiple states. The bimodal H+ and H- kinetic-energy distr
ibutions (KEDs) exhibit an interesting reversal of intensities that su
ggests that the state giving rise to the low-energy peak in one KED gi
ves rise to the high-energy peak in the other KED, and vice versa. Kin
etic energy distributions for the CH3+ ions consisted of only one peak
, indicating a high probability that the CH3+ originates from only one
surface state. Our results indicate that electron-simulated desorptio
n can be used as an adsorption state sensitive probe of chemical speci
es on semiconductor surfaces.