Jg. Kim et al., DEFECT STRUCTURE OF GAAS(111)B (2X2) SURFACE OBSERVED BY SCANNING-TUNNELING-MICROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 2145-2148
Citations number
13
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Scanning tunneling microscopy (STM) and tunneling spectroscopic I-V me
asurements of n-type GaAs(111)B (2 x 2) surfaces are reported. The sam
ples grown by molecular beam epitaxy and the As-capping technique were
employed to allow transfer into the ultrahigh vacuum scanning tunneli
ng microscopy (UHV-STM) system. Filled and empty state images exhibit
a hexagonal array of bright maxima spaced 8 angstrom apart consistent
with the unit cell dimensions. The images show a variety of domain bou
ndaries resulting from surface stacking faults. The domain boundaries
are oriented along [101BAR], [011BAR], and [110BAR] directions. Numero
us defects are observed at the point where these domain boundaries int
ersect. Atomic models for these defects are shown. Scanning tunneling
spectroscopic data indicate that the Fermi level on this surface is pi
nned midgap.