SI(100)2X1+SB SURFACES STUDIED WITH PHOTOEMISSION AND OPTICAL SPECTROSCOPY

Citation
A. Cricenti et al., SI(100)2X1+SB SURFACES STUDIED WITH PHOTOEMISSION AND OPTICAL SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 2327-2331
Citations number
20
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
ISSN journal
07342101
Volume
12
Issue
4
Year of publication
1994
Part
2
Pages
2327 - 2331
Database
ISI
SICI code
0734-2101(1994)12:4<2327:SSSWPA>2.0.ZU;2-U
Abstract
Applying in situ combination of angle-resolved photoelectron spectrosc opy and k-resolved inverse photoemission to Si(100):Sb-1X1 and Si(100) :Sb-2X1 surfaces, we have determined the surface band gaps between the Sb-derived filled and empty surface states at several points of the s urface Brillouin zone. The values of the surface band gaps are compare d with optical surface excitations obtained by means of surface differ ential reflectivity.