MORPHOLOGY AND BONDING MEASURED FROM BORON-NITRIDE POWDERS AND FILMS USING NEAR-EDGE X-RAY-ABSORPTION FINE-STRUCTURE

Citation
Lj. Terminello et al., MORPHOLOGY AND BONDING MEASURED FROM BORON-NITRIDE POWDERS AND FILMS USING NEAR-EDGE X-RAY-ABSORPTION FINE-STRUCTURE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 2462-2466
Citations number
25
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
ISSN journal
07342101
Volume
12
Issue
4
Year of publication
1994
Part
2
Pages
2462 - 2466
Database
ISI
SICI code
0734-2101(1994)12:4<2462:MABMFB>2.0.ZU;2-P
Abstract
Bonding in the hexagonal, cubic (zincblende), rhombohedral, and wurtzi te phases of boron nitride was characterized using core-level photoabs orption. In the boron and nitrogen 1s photoabsorption cross section we observed resonances that were unique to each of the phases and that w ere associated with the sp2 or sp3 bonding present. These spectroscopi c standards were then used to characterize the bonding and morphology in an incoherent thin film of BN based on its core-level photoabsorpti on. The film studied had predominantly sp2 (hexagonal-like) bonding wi th some evidence of sp3 (cubic-phase) bonds.