A portable sample housing has been constructed for room-temperature po
wder geometry X-ray diffraction analysis of samples that are air or mo
isture sensitive. The housing can be easily handled in a glovebox, pro
viding a means for direct loading and X-ray measurements on samples th
at should not be exposed to air or moisture after preparation. Its des
ign allows adaptation to various makes of diffractometer that are limi
ted to flat sample geometry. The design offers several improvements ov
er existing technology, including the accommodation of large-area thin
films and single crystals. Sample preparation and alignment in the X-
ray beam have been found to be easy and efficient. The two-layer X-ray
window of the device reduces the diffracted intensity by 40%, without
any change in the relative intensities of the peaks in the spectrum.