HERMETIC SAMPLE HOUSING FOR X-RAY-DIFFRACTION STUDIES

Citation
Wj. Rink et al., HERMETIC SAMPLE HOUSING FOR X-RAY-DIFFRACTION STUDIES, Journal of applied crystallography, 27, 1994, pp. 666-668
Citations number
10
Categorie Soggetti
Crystallography
ISSN journal
00218898
Volume
27
Year of publication
1994
Part
4
Pages
666 - 668
Database
ISI
SICI code
0021-8898(1994)27:<666:HSHFXS>2.0.ZU;2-O
Abstract
A portable sample housing has been constructed for room-temperature po wder geometry X-ray diffraction analysis of samples that are air or mo isture sensitive. The housing can be easily handled in a glovebox, pro viding a means for direct loading and X-ray measurements on samples th at should not be exposed to air or moisture after preparation. Its des ign allows adaptation to various makes of diffractometer that are limi ted to flat sample geometry. The design offers several improvements ov er existing technology, including the accommodation of large-area thin films and single crystals. Sample preparation and alignment in the X- ray beam have been found to be easy and efficient. The two-layer X-ray window of the device reduces the diffracted intensity by 40%, without any change in the relative intensities of the peaks in the spectrum.