MULTISLICE CALCULATION FOR INP CRYSTALS USING DIFFERENT SLICES

Electron diffraction intensity and high-resolution transmission electr on microscopy (HRTEM) images are calculated for [001] InP crystals usi ng the multi-slice method. The calculation is performed for two preval ent models: (I) atoms within each slice are projected on their represe ntative plane, and (II) atoms are equally shared out among slices and projected on representative planes. Intensities of reflections such as 200, 220 and 400 for model II are appreciably different from those fo r model I, which have very few errors. Forbidden reflections such as 1 10 and 310 appear only in the calculation for model I, changing abrupt ly their intensity every slice in the unit cell, and deviate from Frie del's law. The [001] HRTEM images, visualizing these results, also ind icate that model II is inferior to model I in utility for quantitative analysis.