During the BRITE/EURAM project, a Philips CM30FEG microscope with spec
ial features for high-resolution electron holography has been develope
d and tested [D. Van Dyck, in: Proc, 49th Annual EMSA Meeting, p. 448;
H. Lichte et al., Ultramicroscopy 52 (1993) 575]. The presented first
experimental results with Si [110] reveal that information far beyond
the point resolution limit of the microscope can be retrieved using t
he holographic off-axis reconstruction technique.