STEM CHEMICAL SUBMICRON SCALE INVESTIGATIONS BY EELS IN THE FIELD OF MATERIALS SCIENCE

The S.T.E.M. (V.G. HB/501) is an ideal tool to perform high spatial re solution micro-analysis using techniques such as energy dispersive X-r ay spectroscopy (EDXS), electron energy loss spectroscopy (EELS) and m icrodiffraction. On the basis of some experiments performed in the fie ld of materials science-superconducting ceramic YBa2Cu3O7-delta, alumi nium alloys Al-Mg, cellular precipitation alpha/beta in binary Mg-Al a lloys - we illustrate the capacity of the nanoanalytical microscopy to demonstrate and explain different material behaviours, or to test and improve theoretical models.