Ultraviolet (UV) laser pulses are used to irradiate c-Ge and c-Sb both
in vacuum and in an oxygen pressure while a HeNe laser beam is used t
o record the real time reflectivity (RTR) transients. It will be shown
that the removal of the native oxide and therefore surface cleaning i
s produced when irradiating in vacuum while an oxidation process occur
s when irradiating in an oxygen environment. The optical coupling betw
een the growing oxide layer with the bulk material underneath is respo
nsible of the high sensitivity of the RTR measurements to the presence
or transformation of small thickness oxide layers at the surface. The
RTR transients can be used to optically control pulse-to-pulse the la
ser energy density in order to induce surface oxidation at a constant
rate and to minimize material losses during the oxidation process.