SPECIAL ISSUE ON ELECTRON AND OPTICAL BEAM TESTING OF ELECTRONIC DEVICES - PROCEEDINGS OF THE 3RD EUROPEAN CONFERENCE ON ELECTRON AND OPTICAL BEAM TESTING OF ELECTRONIC DEVICES, SEPTEMBER 1-3, 1993, ZURICH, SWITZERLAND - PREFACE

Authors
BIROLINI A CIAPPA M WOLFGANG E
Citation
A. Birolini et al., SPECIAL ISSUE ON ELECTRON AND OPTICAL BEAM TESTING OF ELECTRONIC DEVICES - PROCEEDINGS OF THE 3RD EUROPEAN CONFERENCE ON ELECTRON AND OPTICAL BEAM TESTING OF ELECTRONIC DEVICES, SEPTEMBER 1-3, 1993, ZURICH, SWITZERLAND - PREFACE, Microelectronic engineering, 24(1-4), 1994, pp. 180000007-180000007
Citations number
NO
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
Microelectronic engineering → ACNP
ISSN journal
01679317
Volume
24
Issue
1-4
Year of publication
1994
Pages
180000007 - 180000007
Database
ISI
SICI code
0167-9317(1994)24:1-4<180000007:SIOEAO>2.0.ZU;2-5