EXPERIMENTAL CHARACTERIZATION OF THE PERTURBATIONS OF MICROWAVE DEVICES BY THE ELECTROOPTIC PROBE TIP

Authors
TAENZLER F MERTIN W DAVID G JAGER D KUBALEK E
Citation
F. Taenzler et al., EXPERIMENTAL CHARACTERIZATION OF THE PERTURBATIONS OF MICROWAVE DEVICES BY THE ELECTROOPTIC PROBE TIP, Microelectronic engineering, 24(1-4), 1994, pp. 123-130
Citations number
NO
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
Microelectronic engineering → ACNP
ISSN journal
01679317
Volume
24
Issue
1-4
Year of publication
1994
Pages
123 - 130
Database
ISI
SICI code
0167-9317(1994)24:1-4<123:ECOTPO>2.0.ZU;2-#
Abstract
Disturbances induced by the electro-optic probe tip of an indirect ele ctro-optic test system are studied experimentally and compared to simu lations. It is shown that the probe tip can have a significant influen ce on the behaviour of the device under test (DUT) when not optimally positioned.