AN INTEGRATED ELECTRON-BEAM PROBING ENVIRONMENT WITH A SIMULATION INTERFACE AND CAD NAVIGATION

Authors
NG W
Citation
W. Ng, AN INTEGRATED ELECTRON-BEAM PROBING ENVIRONMENT WITH A SIMULATION INTERFACE AND CAD NAVIGATION, Microelectronic engineering, 24(1-4), 1994, pp. 287-294
Citations number
NO
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
Microelectronic engineering → ACNP
ISSN journal
01679317
Volume
24
Issue
1-4
Year of publication
1994
Pages
287 - 294
Database
ISI
SICI code
0167-9317(1994)24:1-4<287:AIEPEW>2.0.ZU;2-8
Abstract
This paper describes the use of Integrated Diagnostic Assistant (IDA), a fault isolation software tool, to perform functional silicon debug. The work was done on an electron-beam (e-beam) probing system, direct docked to an automatic test equipment, or ATE. This tool is configure d to accommodate National Semiconductor's mixed signal design environm ent in preparation for development of full analog debug capability,