CHARACTERIZATION OF A MMIC BY DIRECT AND INDIRECT ELECTROOPTIC SAMPLING AND BY NETWORK ANALYZER MEASUREMENTS

Authors
MERTIN W LEYK A TAENZLER F NOVAK T DAVID G JAGER D KUBALEK E
Citation
W. Mertin et al., CHARACTERIZATION OF A MMIC BY DIRECT AND INDIRECT ELECTROOPTIC SAMPLING AND BY NETWORK ANALYZER MEASUREMENTS, Microelectronic engineering, 24(1-4), 1994, pp. 377-384
Citations number
NO
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
Microelectronic engineering → ACNP
ISSN journal
01679317
Volume
24
Issue
1-4
Year of publication
1994
Pages
377 - 384
Database
ISI
SICI code
0167-9317(1994)24:1-4<377:COAMBD>2.0.ZU;2-Q
Abstract
The internal frequency characteristic of a monolithic integrated 1-12 GHz traveling-wave amplifier based on GaAs-substrate is measured by us ing the direct (internal) and indirect (external) electro-optic sampli ng techniques. For the first time, an experimental comparison of both techniques is made. Moreover, the results are compared with convention al network analyzer measurements and simulations.