Y. Gobert et G. Salmer, COMPARATIVE BEHAVIOR AND PERFORMANCES OF MESFET AND HEMT AS A FUNCTION OF TEMPERATURE, I.E.E.E. transactions on electron devices, 41(3), 1994, pp. 299-305
We present an experimental study of MESFET and conventional HEMT behav
ior as a function of temperature and limited to the range from 293 K t
o 393 K. We review the main phenomena appearing under high temperature
conditions, and their effects on FET performances. The most important
degradations concern, except the mobility in HEMT, the noise figure t
hat can increase drastically between 293 K and 393 K. However, we pres
ent structures which seem to be less sensitive to temperature variatio
ns.