A. Pignolet et al., MODEL OF LEAD LOSS IN PB(MGXNB1-X)OZ ION-BEAM SPUTTERED THIN-FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(5), 1994, pp. 2840-2845
Citations number
16
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Thin films of Pb(Mg(x)Nb1-x)O(z) (hereafter called PMN) have been depo
sited on carbon substrate by reactive ion beam sputtering, from a mixe
d oxide-metal multicomponent target composed of magnesium oxide, and m
etallic niobium and lead. The substrate temperature and sputtering gas
composition (oxygen pressure during deposition) were varied and their
effects on the film composition and compositional uniformity were inv
estigated. The major effect seen was the systematic variation in Pb co
ntent with changes in temperature and gas composition. We also observe
d a spatial variation in Pb composition across the substrate and belie
ve this to be caused by film bombardment by argon ions specularly refl
ected by the target surface. This was supported by results showing a s
ystematic reduction in Pb content in films subjected to secondary ion
bombardment during film growth. The selective Pb depletion in PMN film
s is discussed in terms of various mechanisms found in reactive sputte
ring environments.