In spite of a bottle-neck prediction, strong photoluminescence intensi
ty was observed from nanometer-scale GaAs quantum dot structures in si
tu fabricated by a selective growth technique using metal-organic chem
ical vapor deposition. The dot structures showed a large PL peak by ex
citation above the AlGaAs barrier from 8 K to room temperature, while
its intensity largely decreased by excitation below the barrier. This
demonstrates that carrier diffusion smoothly into the dot from the bar
rier region.