R. Schorer et al., VIBRATIONAL PROPERTIES OF SI GE SUPERLATTICES - THEORY AND INPLANE RAMAN-SCATTERING EXPERIMENTS/, Solid-state electronics, 37(4-6), 1994, pp. 757-760
Phonons in short-period (001)-Si(n)Ge(n) Superlattices (SL's) have bee
n studied both theoretically, by a first priniciples approach includin
g strain and interface intermixing, and experimentally by micro-Raman
spectroscopy where in-plane scattering geometries allow the observatio
n of both longitudinal (L) and transverse (T) modes. Experimental data
are found to deviate considerably from theoretical predictions for SL
's with ideally sharp interfaces, both in frequency of higher-order co
nfined Si-like modes and in the polarization dependence of the SiGe-li
ke ''interface'' peak (lineshape and L-T splitting). Supercell calcula
tions representing interface intermixing within a simple model by 2-3
monolayers of SiGe alloy at the interfaces are found to reproduce thes
e major experimental findings. Measurements of Raman resonance profile
s of various SL phonon modes strongly confirm their calculated differe
nt spatial localization.